Lecturers

Prof. Dr. Tong Li
Adj. Prof. Dr.-Ing. habil. Jan Frenzel
Dr. rer. nat. Christoph Somsen

Data

Lecture no.: 138070
Semester: Summer Term
Language: English
Event type: Lecture with Exercise
Contact hours: 4
Credit points: 5
Programs:

• M.Sc. Materials Science and Simulation
• M.Sc. Mechanical Engineering, Specialization Materials and Microengineering
• M.Sc. Sales Engineering and Product Management, Specialization Materials and Microengineering

Description

First, important aspects of the crystalline and amorphous structure of solid matter are reviewed. This is followed by an overview of the interaction of electron beams with matter, discussing secondary electrons, backscattered electrons, elastically and inelastically scattered electrons, as well as the generation of characteristic X-rays, which are important for chemical analysis. The physical origins of image contrast in the scanning and transmission electron microscope are discussed. Particular emphasis is placed on the formation of Kikuchi lines (KL). In the case of scanning electron microscopy, the EBSD/OIM method (Electron Back Scatter Diffraction, Orientation Imaging) is discussed in this context. In the case of transmission electron microscopy, it is shown how Kickuchi patterns are used as crystallographic maps to orient crystals and to set up defined two-beam conditions. Against this background, stereographic 3D methods in the TEM are discussed. In addition, an introduction to atom probe tomography (APT) is given, and it is explained how APT, EBSD, and TEM can be correlated in order to obtain complementary information about the microstructure.